Phenom (electron microscope)
Phenom is by far the fastest electron microscope originally developed by the engineering whizz kids from Philips and FEI in Eindhoven and further developed by Phenom-World. Phenom is a small, table-top sized Scanning Electron Microscope (SEM), with unique navigation due to the combination of optical and electron-optical images: The optical image enables a "Neverlost" function: You can always navigate to any point on the sample, by simply pointing to any position on the optical image. Sample loading takes place in 4 seconds (to obtain the CMOS overview image) and only 30 seconds into the vacuum space via rapid transfer technology (no conventional load lock). The system user interface is controlled with a touch screen. No SEM experience is required for users to achieve magnifications of up to 100,000 times with a resolution of down to 15 nm. An optional fully integrated X-ray analysis (EDS) system, operated in the famous and simple "Phenom-way" shows the user in just seconds what the sample is made of.
gallery
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The leg of a fruit fly imaged with the Phenom. Field of view is 101um.
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Diatoms imaged with the Phenom. Field of view is 50um.
External links
- www.Phenom-World.com
- FEI Sells Phenomâ„¢ Product Line
- US Patent #7906762 - Compact Scanning Electron Microscope
- Publication in: Systems Research Forum (SRF) Vol. 1 (2006) of the Stevens Institute of technology