Specific detectivity
Specific detectivity, or D*, for a photodetector is a figure of merit used to characterize performance, equal to the reciprocal of noise-equivalent power (NEP), normalized per square root of the sensor's area and frequency bandwidth (reciprical of its sampling rate).
Specific detectivity is given by , where is the area of the photosensitive region of the detector and is the frequency bandwidth. It is commonly expressed in Jones units ()in honor of R. Clark Jones who originally defined it.[1][2]
Given that noise-equivalent power can be expressed as a function of the responsivity (in units of or ) and the noise spectral density (in units of or ) as , it's common to see the specific detectivity expressed as .
It is often useful to express the specific detectivity in terms of relative noise levels present in the device. A common expression is given below.
With q as the electronic charge, is the wavelength of interest, h is Planck's constant, c is the speed of light, k is Boltzmann's constant, T is the temperature of the detector, is the zero-bias dynamic resistance area product (often measured experimentally, but also expressible in noise level assumptions), is the quantum efficiency of the device, and is the total flux of the source (often a blackbody) in photons/sec/cm².
References
- ↑ R. C. Jones, "Quantum efficiency of photoconductors," Proc. IRIS 2, 9 (1957)
- ↑ R. C. Jones, "Proposal of the detectivity D** for detectors limited by radiation noise," J. Opt. Soc. Am. 50, 1058 (1960), doi:10.1364/JOSA.50.001058)
This article incorporates public domain material from the General Services Administration document "Federal Standard 1037C".