X-parameters

X-parameters are a mathematical superset of S-parameters and are used for characterizing the amplitudes and relative phase of harmonics generated by nonlinear components under large input power levels.

Contents

Description

X-parameters represent a new category of nonlinear network parameters for high-frequency design and were developed and introduced by Agilent Technologies as functionality included in N5242 Nonlinear Vector Network Analyzer[1][2], and the W2200 Advanced Design System in 2008. (Nonlinear vector network analyzers are sometimes called large signal network analyzers[3].)

X-parameters are applicable to both large-signal and small-signal conditions, for linear and nonlinear components. They are a mathematical superset of S-parameters[4] meaning that, in the limit of a small signal, Agilent’s X-parameters reduce to S-parameters.

They help overcome a key challenge in RF engineering, namely that nonlinear impedance differences, harmonic mixing, and nonlinear reflection effects occur when components are cascaded under large signal operating conditions. This means that there is a nonlinear and as such non-trivial relationship between the properties of the individual cascaded components and the composite properties of the resulting cascade. This situation is unlike that at DC, where one can, for example, simply add the values of resistors connected in series. X-parameters help solve this cascading problem: if you measure the X-parameters of a set of components individually, you can calculate the X-parameters (and hence the non-linear transfer function) of any cascade made from them. Calculations based on X-parameters are usually performed within a harmonic balance simulator environment[5].

X-parameters are based on the polyharmonic distortion modeling work of Dr. Jan Verspecht[6][7] and Dr. David E. Root[7].

While the X-parameter format and underlying equations are open and documented in several IEEE papers[8][9], the trademark owner Agilent also states that Given the rapidly developing state of the technology, as well as finite resources, Agilent currently can provide additional support only to key customers and strategic partners whose efforts are focused on improving the technology.

Notes

  1. ^ "Agilent Technologies Announces Breakthrough in X-Parameter Nonlinear Model Generation for Components Used in Wireless, Aerospace Defense Industries: X-Parameters Enable Model Generation from Simulation or Measurement, for Fast Development". December 17, 2008. http://www.agilent.com/about/newsroom/presrel/2008/17dec-em08200.html. Retrieved May 6, 2009. 
  2. ^ "Agilent N5242A PNA-X Series Microwave Network Analyzer, 10 MHz to 26.5 GHz". http://www.agilent.com/find/nvna. Retrieved 2009,May 1. 
  3. ^ Dr. Jan Verspecht (December 2005). "Large-Signal Network Analysis". IEEE Microwave Magazine (IEEE) 6 (4): 82–92. doi:10.1109/MMW.2005.1580340. http://www.janverspecht.com/pdf/lsnaieeemicrowavemagazine.pdf. Retrieved 2009,May 1. 
  4. ^ "EDA Focus: May 2009, Transcript of interview of David E. Root by Microwave Journal Editor David Vye on April 16th, 2009.". Microwave Journal. April 16, 2009. http://www.mwjournal.com/article.asp?HH_ID=AR_7439. Retrieved May 4, 2009. 
  5. ^ "Agilent NVNA & X-Parameters Simulation in ADS: The new paradigm for nonlinear measurements, modeling, and simulation with ADS (PDF, 1MB) on the X-Parameters MMIC Design Seminar page". http://www.home.agilent.com/agilent/redirector.jspx?action=ref&cname=AGILENT_EDITORIAL&ckey=1619575. Retrieved March 31, 2009. 
  6. ^ Dr. Jan Verspecht (October 1996). "Black Box Modelling of Power Transistors in the Frequency Domain". Conference paper presented at the INMMC '96, Duisburg, Germany. http://users.skynet.be/jan.verspecht/Work/BlackBoxPowerTransistorsINMMC96.pdf. Retrieved May 6, 2009.  (PDF, 85 KB)
  7. ^ a b Dr. Jan Verspecht; Dr. David E. Root (June 2006). "Polyharmonic Distortion Modeling". IEEE Microwave Magazine (IEEE) 7 (3): 44–57. doi:10.1109/MMW.2006.1638289. http://www.janverspecht.com/pdf/phd_ieeemicrowavemagazine.pdf. Retrieved May 6, 2009.  (PDF, 2.4MB)
  8. ^ "X-Parameters Trademark Usage, Open Documentation & Partnerships". http://www.agilent.com/find/eesof-x-parameters-info. 
  9. ^ "X-parameter papers at IEEE Xplore". http://ieeexplore.ieee.org/search/freesearchresult.jsp?newsearch=true&queryText=x-parameter. 

References

External links