Type | Privately held company |
---|---|
Industry | Scientific and Technical Instruments |
Founded | 1992 |
Headquarters | Delmont, Pennsylvania, USA |
Area served | global |
Key people | Harry Shimp, CEO Greg Ott, President |
Products | Scanning Electron Microscope |
Website | www.aspexcorp.com |
Aspex Corporation, originally founded in 1992, is a supplier of electron microscopy tools to researchers, developers and manufacturers working on Process control through automated Scanning Electron Microscope and Energy-dispersive X-ray spectroscopy.
ASPEX specializes in the manufacturing integrated Energy-dispersive X-ray spectroscopy and electron microscope. The company develops automated algorithms for routine production monitoring and control. Aspex's microanalysis solutions are seen in a wide range of production environments, including critical cleanliness, microcontamination analysis, product purity, contamination diagnostics, predictive maintenance, and other statistical process control initiatives.[1] Aspex instruments are typically more industrialized then standard SEM equipment. You will typically find them installed in non-traditional locations, like steel mills and automotive assembly lines. The most common usage revolves around automated feature analysis for particle characterization.
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Aspex Corporation maintains research and development and sales operations in Delmont, Pennsylvania.
The origins of Aspex Corporation date back to 1992 (formally a division of RJ Lee Group, Inc.) where developers recognized the limitations and costs associated with traditional scanning electron microscopy (SEM). As a result, the company developed and introduced the world's first "personalized" SEM, or PSEM. The timing of the introduction coincided with a number of important trends, including increased emphasis on materials characterization, the outsourcing of R&D applications to service laboratories, and the "quality revolution" of the 1990s. Since then, Aspex has continued to develop various industrialized SEMs for quality and process control purposes.
1. Fred Schamber and Kai van Beek, "A ‘Different’ Kind of Microscopy", Microscopy Today, January 2007.
2. Timothy J. Drake, et al. "Development of an High-Throughput Inclusion Analyzer for Process Control and Optimization", AISTech, Proceedings May 2008.
3. David Castaldo, "Identification of Foreign Particles Below 10 Microns Key to Inhaled Drug Quality", Pharmaceutical Processing, May 2004.