Talk:Wafer testing

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This is the talk page for discussing improvements to the Wafer testing article.

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[edit] Wafer Sort Cost Analysis

Can wafer sort operation skip is a wise step when production yield (Sort yield) is so high ? —Preceding unsigned comment added by 130.86.73.91 (talk • contribs) 18:48, 7 October 2006

[edit] Possibly dated information

The article mentions the following: "This wafermap is then sent by a network or floppy disk to the die attachment process" Is that current? because I can't imagine floppies being used. Perhaps someone that has more recent familiarity to production could correct this if needed. Wwhat (talk) 17:33, 10 December 2007 (UTC)


[edit] Undid Merger

The consensus on the merger into Wafer_(electronics) has changed. Since the wafer article has growth, this topic no longer fits within that article and has been moved back into its own page. Dspark76 (talk) 02:49, 24 February 2008 (UTC)