Transmission line pulse

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(TLP) is a way to study integrated circuit technologies and circuit behavior in the current and time domain of ESD events. The method became indispensable for integrated circuit ESD protection development, especially after Barth Electronics introduced the first commercial TLP system in the mid-1990s. Time Domain Reflection (TDR) TLP with a 100 ns pulse length is the most common version, shown schematically in Figure 1. A 50Ω transmission line is charged through a high value resistor. The length of the transmission line determines the length of the pulse. Flipping switch S initiates a pulse which travels on 50Ω cable, through an attenuator, to the device under test (DUT), and reflects from the DUT back to the attenuator. The 50Ω 10X attenuator prevents multiple reflections. Voltage and current probes between the attenuator and the DUT capture the pulse waveforms on a single shot digital oscilloscope.

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