User:Thermochap/Sandbox/TEMprep

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Notes on electron microscope specimen prep are under development here with wikiproject microscopy in mind.

Contents 1 Planar section prep 1.1 Wafer cleaving 1.1.1 chemwipes method 1.1.2 straightedge method 1.1.3 pliers method 1.2 Disc cutting 1.3 Abrasive thinning 1.3.1 Single side 1.3.2 Double side 1.4 Dimpling 1.5 Argon Ion Milling 1.5.1 Non-focused ion beam 1.5.2 Precision ion beam 1.5.3 Focused ion beam 2 Cross section prep 2.1 Cake method 2.1.1 Making the cake 2.1.2 Slicing the cake 2.2 Tube method 2.2.1 Filling the tube 2.2.2 Slicing the tube 3 Footnotes 4 See Also

[edit] Planar section prep

[edit] Wafer cleaving

[edit] chemwipes method

[edit] straightedge method

[edit] pliers method

[edit] Disc cutting

[edit] Abrasive thinning

[edit] Single side

[edit] Double side

[edit] Dimpling

[edit] Argon Ion Milling

[edit] Non-focused ion beam

[edit] Precision ion beam

[edit] Focused ion beam

[edit] Cross section prep

[edit] Cake method

[edit] Making the cake

[edit] Slicing the cake

[edit] Tube method

[edit] Filling the tube

[edit] Slicing the tube

[edit] Footnotes

[edit] See Also