Image:TEM cross-section of epitaxially grown silicon and sapphire substrate.JPG
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TEM_cross-section_of_epitaxially_grown_silicon_and_sapphire_substrate.JPG (408 × 343 pixels, file size: 114 KB, MIME type: image/jpeg)
[edit] Summary
Structure of the Peregine SOS substrate adjacent to a polysilicon gate. The dark lines visible in the silicon layer show examples of silicon lattice defects.
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| Date/Time | Dimensions | User | Comment | |
|---|---|---|---|---|
| current | 20:45, 29 August 2007 | 408×343 (114 KB) | SemiCon (Talk | contribs) | (Structure of the Peregine SOS substrate adjacent to a polysilicon gate. The dark lines visible in the silicon layer show examples of silicon lattice defects.) |
| 20:09, 29 August 2007 | 1,832×1,539 (1,015 KB) | SemiCon (Talk | contribs) | (Structure of the Peregine SOS substrate adjacent to a polysilicon gate. The dark lines visible in the silicon layer show examples of silicon lattice defects.) | |
| 14:16, 1 August 2007 | 408×317 (22 KB) | SemiCon (Talk | contribs) | (Structure of the Peregine SOS substrate adjacent to a polysilicon gate. The dark lines visible in the silicon layer show examples of silicon lattice defects.) |
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| Orientation | Normal |
|---|---|
| Horizontal resolution | 300 dpi |
| Vertical resolution | 300 dpi |
| Software used | Adobe Photoshop CS2 Windows |
| File change date and time | 16:40, 29 August 2007 |
| Color space | 65535 |
