Scanning Hall probe microscope

From Wikipedia, the free encyclopedia

The scanning Hall probe microscope (SHPM) is a class of scanning probe microscope which incorporates the accurate sample approach and positioning of the scanning tunnelling microscope with a semiconductor Hall sensor. This combination allows a map of the magnetic induction associated with a sample to be created. Current state of the art SHPM systems utilise 2D electron gas materials (e.g. GaAs/AlGaAs) to provide high spatial resolution (>300 nm) imaging with high magnetic field sensitivity. Unlike the magnetic force microscope the SHPM provides direct quantitative information on the magnetic state of a material. The SHPM can also image magnetic induction under applied fields up to ~1 tesla and over a wide range of temperatures (millikelvins to 300 K).

[edit] References

A. M. Chang, H.D. Hallen, L. Harriot, H.F. Hess, H. L. Los, J. Kao, R.E. Miller and T.Y. Chang, Appl. Phys. Lett. 61, 1974 (1992).

[edit] See also

• Scanning probe microscope
• Scanning tunneling microscope

v • d • e Scanning probe microscopy Common Atomic force · Scanning tunneling Other Electrostatic force · Electrochemical scanning tunneling · Kelvin probe force · Magnetic force · Magnetic resonance force · Near-field scanning optical · Photothermal microspectroscopy · Scanning capacitance · Scanning gate · Scanning Hall probe · Scanning ion-conductance · Spin polarized scanning tunneling · Scanning voltage Applications Scanning probe lithography · Dip-Pen Nanolithography · Feature-oriented scanning · IBM Millipede See also Nanotechnology · Microscope · Microscopy