Michael Orshansky
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Michael Orshansky is an American researcher in integrated circuit design, currently with University of Texas at Austin since 2003. Her received his undergraduate education and Ph.D. at the UC Berkeley.[1]
His research interests include statistical CAD algorithms for design for manufacturability, robust circuit design in the presence of process variability, low-power circuit design, modeling and characterization of semiconductor devices.
He is a recipient of the 2004 National Science Foundation Early Career Development Award (CAREER award)[2], the 2004 IEEE Transactions on Semiconductor Manufacturing Best Paper Award,[3] the Best Paper Award at the 2005 Design Automation Conference[4] and the annual SIGDA Outstanding New Faculty Award.[5]
[edit] Works
- (With Sani Nassifand Duane Boning) (2007) "Design for Manufacturability and Statistical Design: A Constructive Approach", Springer, ISBN 0387309284
[edit] References
- ^ Orshansky's home page at UTA
- ^ "Engineer gets $400,000 from the National Science Foundation to improve reliability of nano-sized microchip behavior"
- ^ "2004 Best Paper Awards", IEEE Trans. SM, vol. 18, no. 4, 2005. — award for “Characterization of Spatial Intrafield Gate CD Variability, Its Impact on Circuit Performance, and Spatial Mask-Level Correction,” by Michael Orshansky, Linda Milor, and Chenming Hu.
- ^ Orshansky profile at the faculty directory
- ^ "Assistant prof honored by SIGDA"
