List of materials analysis methods
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List of materials analysis methods:
| Contents | Top · 0–9 · A B C D E F G H I J K L M N O P Q R S T U V W X Y Z |
[edit] A
- Analytical ultracentrifugation - Analytical ultracentrifugation
- AAS - Atomic absorption spectroscopy
- AED - Auger electron diffraction
- AES - Auger electron spectroscopy
- AFM - Atomic force microscope
- APFIM - Atom probe field ion microscopy
- APS - Appearance potential spectroscopy
- ATR - Attenuated total reflectance
- AXRS - Anomalous X-ray scattering
[edit] B
- BET - BET surface area measurement
- BKD - Backscatter Kikuchi diffraction, see EBSD
- BiFC - Bimolecular fluorescence complementation
- BRET - Bioluminescence resonance energy transfer
- BSE - Back scattered electron
- BSED - Back scattered electron diffraction, see EBSD
[edit] C
- CAICISS - Coaxial impact collision ion scattering spectroscopy
- CBED - Convergent beam electron diffraction
- CET - Cryo-electron tomography
- CCM - Charge collection microscopy
- CL - Cathodoluminescence
- CLSM - Confocal laser scanning microscopy
- CDI - Coherent diffraction imaging
- COSY - Correlation spectroscopy
- Cryo-EM - Cryo-electron microscopy
- CV - Cyclic voltammetry
[edit] D
- DE(T)A - Dielectric thermal analysis
- dHvA - De Haas-van Alphen effect
- Dielectric spectroscopy - Dielectric spectroscopy
- DIC - Differential interference contrast microscopy
- DLS - Dynamic light scattering
- DMA - Dynamic mechanical analysis
- DSC - Differential scanning calorimetry
- DVS - Dynamic vapour sorption
[edit] E
- EBIC - Electron beam induced current
- EBSD - Electron backscatter diffraction
- ECOSY - Exclusive correlation spectroscopy
- ECT - Electrical capacitance tomography
- EDX - Energy dispersive X-ray spectroscopy
- EELS - Electron energy loss spectroscopy
- EFTEM - Energy filtered transmission electron microscopy
- EID - Electron induced desorption
- EIT and ERT - Electrical impedance tomography and Electrical resistivity tomography
- Electron crystallography - Electron crystallography
- ELS - Electrophoretic light scattering
- EPMA - Electron probe microanalysis
- ESEM - Environmental scanning electron microscopy
- ESCA - Electron spectroscopy for chemical analysis* see XPS
- ESI-MS or ES-MS - Electrospray ionization mass spectrometry or Electrospray mass spectrometry
- ESTM - Electrochemical scanning tunneling microscope
- EPR - Electron paramagnetic resonance spectroscopy
- ESD - Electron stimulated desorption
- ESR - Electron spin resonance spectroscopy
- EXAFS - Extended X-ray absorption fine structure
- EXSY - Exchange spectroscopy
[edit] F
- FCS - Fluorescence correlation spectroscopy
- FCCS - Fluorescence cross-correlation spectroscopy
- FEM - Field emission microscopy
- FIB - Focused ion beam microscopy
- FIM-AP - Field ion microscopy–atom probe
- Flow birefringence - Flow birefringence
- Fluorescence anisotropy - Fluorescence anisotropy
- FLIM - Fluorescence lifetime imaging
- Fluorescence microscopy - Fluorescence microscopy
- FRET - Fluorescence resonance energy transfer
- FTICR or FT-MS - Fourier transform ion cyclotron resonance or Fourier transform mass spectrometry
- FTIR - Fourier transform infrared absorption spectroscopy
[edit] G
- GC-MS - Gas chromatography-mass spectrometry
- GDMS - Glow discharge mass spectrometry
- GDOS - Glow discharge optical spectroscopy
- GISAXS - Grazing incidence small angle X-ray scattering
- GIXD - Grazing incidence X-ray diffraction
- GIXR - Grazing incidence X-ray reflectivity
- GLC - Gas-liquid chromatography
[edit] H
- HAS - Helium atom scattering
- HPLC - High performance liquid chromatography
- HREELS - High resolution electron energy loss spectroscopy
- HRTEM - High-resolution transmission electron microscopy
[edit] I
- IAES - Ion induced Auger electron spectroscopy
- IBIC - Ion beam induced charge microscopy
- ICP-MS - Inductively coupled plasma mass spectrometry
- Immunofluorescence - Immunofluorescence
- ICR - Ion cyclotron resonance
- IETS - Inelastic electron tunneling spectroscopy
- IGA - Intelligent gravimetric analysis
- IIX - Ion induced X-ray analysis
- INS - Ion neutralization spectroscopy
Inelastic neutron scattering - IRS - Infrared spectroscopy
- ISS - Ion scattering spectroscopy
- ITC - Isothermal titration calorimetry
- IVEM - Intermediate voltage electron microscopy
[edit] L
- List of materials analysis methods (deliberate self-link)
- LALLS - Low-angle laser light scattering
- LC-MS - Liquid chromatography-mass spectrometry
- LEED - Low-energy electron diffraction
- LEEM - Low-energy electron microscopy
- LEIS - Low-energy ion scattering
- LIBS - Laser induced breakdown spectroscopy
- LOES - Laser optical emission spectroscopy
- LS - Light (Raman) scattering
[edit] M
- MALDI - Matrix-assisted laser desorption/ionization
- MIT - Magnetic induction tomography
- MRFM - Magnetic resonance force microscopy
- MRI - Magnetic resonance imaging
- MS - Mass spectrometry
- MS/MS - Tandem mass spectrometry
- MEIS - Medium energy ion scattering
- Mössbauer spectroscopy - Mössbauer spectroscopy
- MTA - Microthermal analysis
[edit] N
- Nanovid microscopy - Nanovid microscopy
- ND - Neutron diffraction
- NDP - Neutron depth profiling
- NAA - Neutron activation analysis
- NEXAFS - Near edge X-ray absorption fine structure
- NMR - Nuclear magnetic resonance spectroscopy
- NOESY - Nuclear Overhauser effect spectroscopy
- NSOM - Near-field optical microscope
[edit] O
- OES - Optical emission spectroscopy
- Osmometry - Osmometry
[edit] P
- PAS - Positron annihilation spectroscopy
- PAT or PACT - Photoacoustic tomography or photoacoustic computed tomography
- PAX - Photoemission of adsorbed xenon
- PC or PCS - Photocurrent spectroscopy
- PD - Photodesorption
- PDEIS - Potentiodynamic electrochemical impedance spectroscopy
- PED - Photoelectron diffraction
- Porosimetry - Porosimetry
- Phase contrast microscopy - Phase contrast microscopy
- PIXE - Particle (or proton) induced X-ray spectroscopy
- Powder diffraction - Powder diffraction
- PTMS - Photothermal microspectroscopy
[edit] Q
- QENS - Quasi-elastic neutron scattering
[edit] R
- Raman - Raman spectroscopy
- RAXRS - Resonant anomalous X-ray scattering
- RBS - Rutherford backscattering spectroscopy
- REM - Reflection electron microscopy
- RHEED - Reflection high energy electron diffraction
- RR spectroscopy - Resonance Raman spectroscopy
[edit] S
- SAM - Scanning Auger microscopy
- SANS - Small angle neutron scattering
- SAXS - Small angle X-ray scattering
- SCANIIR - Surface composition by analysis of neutral species and ion-impact radiation
- SE - Spectroscopic ellipsometry
- SEC - Size exclusion chromatography
- SEIRA - Surface enhanced infrared absorption spectroscopy
- SEM - Scanning electron microscopy
- SERS - Surface enhanced Raman spectroscopy
- SEXAFS - Surface extended X-ray absorption fine structure
- SICM - Scanning ion-conductance microscopy
- SIMS - Secondary ion mass spectrometry
- SNMS - Sputtered neutral species mass spectroscopy
- SNOM - Scanning near-field optical microscopy
- SPECT - Single photon emission computed tomography
- SPM - Scanning probe microscopy
- SRM-CE/MS - Selected-reaction-monitoring capillary-electrophoresis mass-spectrometry
- SSNMR - Solid-state nuclear magnetic resonance
- Stark spectroscopy - Stark spectroscopy
- STEM - Scanning transmission electron microscopy
- STM - Scanning tunneling microscopy
[edit] T
- TEM - Transmission electron microscopy
- TAT or TACT - Thermoacoustic tomography or thermoacoustic computed tomography (see also photoacoustic tomography - PAT)
- TGA - Thermogravimetric analysis
- TIRFM - Total internal reflection fluorescence microscopy
- TMA - Thermomechanical analysis
- TXRF - Total reflection X-ray fluorescence analysis
- Two-photon excitation microscopy - Two-photon excitation microscopy
[edit] U
- Ultrasound attenuation spectroscopy - Ultrasound attenuation spectroscopy
- Ultrasonic testing - Ultrasonic testing
- UPS - UV-photoelectron spectroscopy
[edit] V
- VEDIC - Video-enhanced differential interference contrast microscopy
- Voltammetry - Voltammetry
[edit] W
- WAXS - Wide angle X-ray scattering
- WDXRF or WDS - Wavelength dispersive X-ray spectroscopy
[edit] X
- XAES - X-ray induced Auger electron spectroscopy
- XANES - XANES, synonymous with NEXAFS (Near edge X-ray absorption fine structure)
- XAS - X-ray absorption spectroscopy
- X-CTR - X-ray crystal truncation rod scattering
- X-ray crystallography - X-ray crystallography
- XDS - X-ray diffuse scattering
- XPEEM - X-ray photoelectron emission microscopy
- XPS - X-ray photoelectron spectroscopy
- XR - X-ray reflectivity
- XRD - X-ray diffraction
- XRF - X-ray fluorescence analysis
- XSW - X-ray standing wave technique
[edit] References
- Callister, WD (2000). Materials Science and Engineering - An Introduction. John Wiley and Sons : London. ISBN 0-471-32013-7.
- (2007) in Yao, N: Focused Ion Beam Systems: Basics and Applications. Cambridge University Press : Cambridge, UK. ISBN 978-052183-1994.
