Image:Kelvin probe force microscopy.svg
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Kelvin_probe_force_microscopy.svg (SVG file, nominally 860 × 470 pixels, file size: 83 KB)
| This is a file from the Wikimedia Commons. The description on its description page there is shown below.
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[edit] Summary
| Description |
In Kelvin probe force microscopy, a conducting cantilever is scanned over a surface at a constant height while an AC+DC potential is applied. The AC signal is a sinusoid whose frequency matches the mechanical resonance of the cantilever. The cantilever is driven into oscillation by electrostatic forces where the DC potential difference between the surface and the cantilever is non-zero. Using a four-quadrant detector and an A/D to detect cantilever motion, the feedback circuit drives the DC signal to the surface potential, minimizing cantilever motion and resulting in a map of the work function of the surface. |
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| Source |
Own work |
| Date |
March 1, 2008 (UTC+0100) |
| Author | |
| Permission (Reusing this image) |
see below |
| Other versions | Image:Kpfm.png |
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This vector image was created with Inkscape. |
[edit] Credit
Based on Image:Kpfm.png drawn by Alison Chaiken using the xfig program. Originally uploaded as w:Kpfm.png.
[edit] Licensing
File history
Click on a date/time to view the file as it appeared at that time.
| Date/Time | Dimensions | User | Comment | |
|---|---|---|---|---|
| current | 16:53, 1 March 2008 | 860×470 (83 KB) | Inkwina | (Fixed SVG) |
| 16:21, 1 March 2008 | 860×470 (84 KB) | Inkwina | ({{Information |Description=In Kelvin probe force microscopy, a conducting cantilever is scanned over a surface at a constant height while an AC+DC potential is applied. The AC signal is a sinu) |
