Feature-oriented scanning

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Feature-oriented scanning (FOS)[1][2] is a method intended for high-precision measurement of nanotopography as well as other surface properties and characteristics on a scanning probe microscope (SPM) using features (objects) of the surface as reference points of the microscope probe. With this method, during successive passings from one surface feature to another one located nearby, the relative distance between the features and the topography of their neighborhoods called surface segments are measured. Such approach permits to scan the required area of the surface by parts and then reconstruct the whole image from the obtained fragments. Beside the mentioned, it is acceptable to use another name for the method — object-oriented scanning (OOS).

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[edit] References

  1. ^ R. V. Lapshin, “Feature-oriented scanning methodology for probe microscopy and nanotechnology”, Nanotechnology, volume 15, issue 9, pages 1135-1151, 2004.
  2. ^ R. V. Lapshin, “Automatic drift elimination in probe microscope images based on techniques of counter-scanning and topography feature recognition”, Measurement Science and Technology, volume 18, issue 3, pages 907-927, 2007.

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