Talk:Built-in self-test

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Shouldn't there be some mention of POST (Power-on Self-test) and link to that article?

Yes, POST, Initiated BIT, and Continuous BIT should be added as part of BIT, and BIST should be a subset of BIT.

I rule !

[edit] Marian Marinescu

The reference hinted at by the redlink is to the following paper:

• Marinescu, M., 1982. Simple and Efficient Algorithms for Functional RAM Testing. 1982 IEEE Test Conference, Philadelphia, (Nov.). IEEE Computer Society, pp. 236-239.

DFH 14:13, 4 January 2007 (UTC)