Bruker AXS

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Bruker AXS is a global instrument manufacturer and supplier. The company is part of Bruker and specializes in Analytical X-Ray Systems. The main parts are their X-Ray Diffraction (XRD), X-ray Fluorescence (XRF), and Protein Crystallography segments. Recent acquisitions include companies specializing in handheld XRF, X-ray microanalysis products such as X-ray detectors for Scanning Electron Microscopes, Optical Emission Spectroscopy (Spark-OES), and Combustion Analysis instrumentation to address the foundry and smelter metals marketplaces. Bruker AXS has strong nanotechnology expertise and products, causing the parent Bruker Corporation to be listed in two nanotechnology stock market indexes. The Bruker AXS headquarters are in Madison, USA and Karlsruhe, Germany.

1 Company History
2 X-ray analysis
3 X-Ray Diffraction
4 X-Ray Fluorescence
5 External links

[edit] Company History

1996 AXS GmbH founded as a former Siemens company
1997 Acquired by Bruker - now called Bruker AXS GmbH
1998 Presentation of the D8 Diffractometer
2001 Acquisition of Nonius BV in Delft, The Netherlands
2002 Acquisition of MacScience Corporation in Yokohama, Japan
2005 Acquisition of Röntec in Berlin, Germany
2006 Acquisition of Quantron GmbH in Kleve, Germany
2006 Acquisition of Keymaster Technologies in Washington, USA

[edit] X-ray analysis

The AXS in the name stands for Advanced X-Ray Solutions. The portfolio consists of 6 product lines.

[edit] X-Ray Diffraction

Bruker AXS is a manufacturer of X-Ray Diffractometers with full radiation protection. This means, the "User" of the Diffractometer can work safely with X-Rays and is not hurt by them. This includes a safety system that prevents an open X-Ray Beam, when the User opens the case of the diffractometer on the one hand and on the other hand a thick layer of lead covers the case to bring the external radiation to a minimum.

[edit] X-Ray Fluorescence

Bruker AXS also produces X-Ray Fluorescence XRF spectrometers for research and industrial applications. The S4 EXPLORER, S4 PIONEER and S8 TIGER employ wavelenght dispersive XRF to detect elements from Be to U in the range of 100% down to 0.1 ppm. The benchtop analyzers S2 RANGER and S2 PICOFOX as well as the ARTAX system use the energy dispersive XFlash detector to seperate the XRF of the elements from Na to U.