Image:AFMsetup.jpg

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[edit] Summary

  • Figure Caption: Typical AFM setup. The deflection of a microfabricated cantilever with a sharp tip is measured by reflecting a laser beam off the backside of the cantilever while it is scanning over the surface of the sample.
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File history

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Date/TimeDimensionsUserComment
current14:10, 21 November 2006721×569 (86 KB)KristianMolhave (*Figure Caption: Typical AFM setup. The deflection of a microfabricated cantilever with a sharp tip is measured be reflecting a laser beam off the backside of the cantilever while it is scanning over the surface of the sample. *This illustration was made)