Ion beam analysis
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Ion beam analysis is an important family of modern analytical techniques involving the use of MeV ion beams to probe the composition, obtain elemental depth profiles, or determine the depth profile of damage in single crystals. The last conference (Seville, Spain, 2005) was published in Nuclear Instruments and Methods.
- RBS: Rutherford backscattering is sensitive to heavy elements in a light matrix
- ERD: Elastic recoil analysis is sensitive to light elements in a heavy matrix
- PIXE: Particle induced X-ray emission gives the trace and minor elemental composition
- NRA: Nuclear reaction analysis is sentitive to particular isotopes
Channelling:
[edit] External links
- Bi-annual scientific conference devoted to IBA: the latest was in Seville in June 2005
- The next in this series (18th) will be held in Hyderabad, India in September 2007.
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