Talk:Automatic test equipment

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[edit] Wafer probing merge

Wafer probing can also be done in manually operated stand alone systems for first article inspection work. Burying wafer probing in automatic test will loose visibility to manual probing. —The preceding unsigned comment was added by 71.223.6.55 (talk • contribs) 20:20, 16 January 2007.

I would suggest that Wafer prober and Wafer testing be merged. Possibly merge those into Wafer (electronics) as well. All that wafer stuff is obviously fairly closely related. I would say these wafer topics do not belong under Automatic test equipment. I am going to put merge boxes to that effect on the appropriate articles. —DragonHawk (talk) 05:33, 17 January 2007 (UTC)

I agree that wafer probing is a subset of ATE, but these articles should definitely NOT be merged. --Rbenech 03:06, 25 January 2007 (UTC)

Wafer probing investigates if the device has passed the engineering specifications for proper transistor operation and to validate other process parameters. No attempt is typically made to carefully assess the complete circuit functionality nor the functionality at speed. Transistor testing is typically done in a manual or semiautomatic fashion and involves a good deal of electrical engineering feedback to process engineering. There is a further level of wafer scale ATE testing that is much more at the heart of manufacturing, where full functionality of the die is investigated but again, no attempt is made (typically)to assess the functionality at speed. On the basis of this test, die are identified for packaging. Simplified transistor testing is associated with this test as well and is the basis for the speed test pass at this stage. After packaging micro devices are inspected with an ATE system and more realistic testing, possibility including full function at speed, or full function at some slower speed that is acceptable to both manufacturer and buyer is done. There is a clear distinction between the transistor level tests and the ATE die function tests, and (often) a completely different set of test equipment. Separation seems supportable. 64.122.171.194 23:56, 14 March 2007 (UTC)