X-ray reflectivity
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An extension of optical reflectivity method to x-ray domain: a specularly reflected (angle of incidence is equal to angle of reflection) signal is detected as both angles are varied simultaneously. Normalized to incident intensity of x-ray beam and is commonly expressed as a function of wavevector transfer qz.
X-ray reflectivity (XR) is a powerful surface-sensitive technique used to determine surface structure of a wide range of materials on atomic and nanoscales. One of the simplest formulas describing theoretically expected reflectivity from ideally smooth and sharp, structureless interface was derived by Augustin-Jean Fresnel and is known as Fresnel reflectivity.
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