Image:Leiterbahn ausfallort elektromigration.jpg
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Leiterbahn_ausfallort_elektromigration.jpg (65KB, MIME type: image/jpeg)
Failure of a copper conductive strip due to electromigration, viewed with a scanning electron microscope. The passivation layer was removed using reactive ion etching and hydrofluoric acid.
Source: scanning electron microscope photograph
Photographer: Patrick-Emil Zörner
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This image is licensed under the Creative Commons Attribution ShareAlike License v. 2.0: http://creativecommons.org/licenses/by-sa/2.0/ |
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- (del) (cur) 16:52, 28 April 2004 . . Paddyez (Talk | contribs) . . 512×512 (66,389 bytes) (From the german Wikipedia by Patrick-Emil Zörner)
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