Image:Diffractometre montage chi reflexion.png

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Diffractometre_montage_chi_reflexion.png‎ (6KB, MIME type: image/png)

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[edit] Summary

Diffractomètre de rayons X et berceau d'Euler : montage χ pour la mesure de texture et des containtes en réflexion.

X-ray diffractometer with an Eulerian cradle: χ mode, for reflection texture and stress measurement.

Auteur/author : Christophe Dang Ngoc Chan (cdang)

[edit] Licensing

GNU head Permission is granted to copy, distribute and/or modify this document under the terms of the GNU Free Documentation License, Version 1.2 or any later version published by the Free Software Foundation; with no Invariant Sections, no Front-Cover Texts, and no Back-Cover Texts. A copy of the license is included in the section entitled "GNU Free Documentation License".

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