CV profiling

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"CV", or more correctly "C-V", stands for Capacitance-Voltage, and refers to a technique used for characterization of semiconductor materials and devices. The technique uses a metal-semiconductor junction (Schottky barrier) or a p-n junction to create a depletion region, a region which is empty of conducting electrons and donors and other traps are ionized. By varying the voltage applied to the junction it is possible to vary the depletion region extension. The depletion region with its ionized charges inside behaves like a capacitor by which it is possible to gain information on its dielectric (the inside semiconductor material). By measuring the capacitance at various voltage levels one can obtain a C-V Profile.

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